Nanovea Develops Revamped 3D Profilometer For AR Coating Measurement


Irvine, Calif.-headquartered Nanovea Inc. says it has added a confocal spectral interferometer sensor to its Nanovea 3D Profilometer, which is designed to allow users to measure anti-reflective (AR) coating thickness in PV applications. Users now have the expanded capability to measure AR coating thickness down to 200 nm, according to the company.

The system provides users with multiple measurement technologies, including Nanovea's traditional chromatic confocal optics alongside a confocal spectral interferometer, atomic force microscope and an optical microscope for visual inspection. The instrument is calibrated for quick and easy movements between each option, the company adds.

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