BrightView Systems, a Petach-Tikva, Israel-based provider of market-process and production-optimization technologies for thin-film photovoltaics, has completed the integration and validation of its Wide Area Metrology (WAM) process metrology and mapping solution for Signet Solar's production line in Mochau, Germany.
The WAM tool, developed by start-up BrightView Systems, features in-line, true-cell-metrology and measurement capabilities and an associated suite of control applications for excursion detection, chamber matching and process window optimization.
Through the tool, Signet Solar was able to implement, for the first time, fully automated, continuous full-panel process monitoring and feedback on 100% of production panels and greatly reduced reliance on off-line measurements and special test-panel cycles.
SOURCE: BrightView Systems
