Dark Field Technologies Releases NxtGen Scribe For Thin-Film Metrology


Dark Field Technologies has introduced the NxtGen Scribe system, which provides solar thin-film scribe line metrology. The company says the systems deliver 100% online, real-time P1, P2 and P3 scribe line inspection, while simultaneously measuring scribe width plus or minus 2 micrometers to 5 micrometers.

NxtGenScribe is a part of the new NxtGen family of inspection and metrology systems. It features speeds of up to 30 m/min., performance independent of orientation of scribes., special dark-field optics to deliver sub-pixel detection and measurement and large depth of field, and automatic panel rejection if quality limits are breached.

Dark Field Technologies: (203) 298-0731

SOURCE: Dark Field Technologies

Notify of
oldest most voted
Inline Feedbacks
View all comments