Keithley Instruments Inc., a provider of electrical test instruments and systems, has introduced a variety of hardware, firmware and software enhancements to its Model 4200-SCS Semiconductor Characterization System.
The Keithley Test Environment Interactive (KTEI) V7.2 upgrade includes nine new solar cell test libraries, an expanded frequency range for the system's Capacitance-Voltage (C-V) measurement capability and support for the company's new nine-slot Model 4200-SCS instrument chassis.
The new test libraries included in KTEI V7.2 expand the Model 4200-SCS's capabilities for solar cell I-V, C-V and resistivity testing applications. According to the company, these capabilities are increasingly important, given the growing interest in and governmental support for alternative energy technologies.
The software upgrade also supports Drive-Level Capacitance Profiling (DLCP), a new solar cell testing technique that was difficult to perform accurately using earlier test solutions. DLCP provides defect density information on thin-film solar cells. Existing Model 4200-CVU Capacitance-Voltage Unit cards, which were introduced in November 2007, can be readily modified to support this testing technique.
Keithley Instruments Inc.: (800) 688-9951
SOURCE: Keithley Instruments Inc.
