Nanometrics Notes New Order For PV Metrology System

Nanometrics Inc., a supplier of metrology systems, says that a ‘major manufacturer of advanced thin-film solar photovoltaic cells’ has selected and installed the latest generation of its Trajectory Solar Monitor (TSM) metrology system for in-line process monitoring and control of copper indium gallium diselenide films.

Established as a tool for rapid film-thickness measurement, the TSM now includes photoluminescence scanning, further expanding its applications and market opportunities, the company adds.

Nanometrics did not disclose the name of the thin-film manufacturer.


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