Nanometrics Inc., a supplier of process-control metrology systems, has launched the TSM integrated metrology system.
The latest in Nanometrics' Trajectory product line, the TSM is designed to rapidly measure the thickness of various thin films in order to enable fast feedback and excursion prevention in the manufacture of all types of solar photovoltaic cells. The product further expands Nanometrics' metrology system footprint into the segment of rough and textured PV film layers, the company notes.
‘Every solar PV cell manufacturing line has unique process-control challenges due to the engineered films that are deposited,’ says Tom Ryan, director of the materials characterization business unit at Nanometrics. ‘The TSM is optimized for film measurement on high-throughput processes, enabling control on textured crystalline silicon cells, complex multi-junction thin-film silicon cells and high-roughness CIGS and CdTe films.’
Nanometrics Inc.: (408) 545-6000
SOURCE: Nanometrics Inc.