Solar Metrology Introduces System SMX-ISI For CIGS Measurement


Solar Metrology, a global provider of x-ray fluorescence (XRF) analysis tools, has expanded its SMX XRF tool portfolio for film composition and thickness measurement of CIGS photovoltaic depositions with the addition of the System SMX-ISI.

System SMX-ISI is an in-situ XRF metrology tool platform that provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates, such as stainless steel, aluminum and polyimide, or rigid substrates such as float glass.

Typical measurement applications include Mo thickness and all CIGS combinations (including all CIG alloys and/or film combinations and final CIGS formulations).

Solar Metrology: (631) 419-6246

SOURCE: Solar Metrology

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